Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900

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Model	Waveline W600 / Waveline W800 / Waveline W900
Manufacturer	Brand HOMMEL ETAMIC (a part of the JENOPTIK AG)
Power supply	100-240 V AC 50/60 Hz
Weight	N/A
Size	N/A
Condition	Stocking
Warranty	12 months

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Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900 with all measuring station configurations are modular in design and can therefore be easily expanded at a later date.

With these HOMMEL ETAMIC Waveline systems, you measure surfaces exactly as it fits your individual infrastructure and your specific measurement tasks.

I. Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900 for your applications

Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900 with maximum flexibility and efficiency in daily measuring practice.

At the same time, the measuring systems are easy to operate and have a wide range of analysis options thanks to the Evovis measuring and evaluation software.

Universal, easy-to-use measuring system
High measurement quality thanks to stable mechanics
Quick-change adapter QCA enables quick probe system changeover with minimum retooling time and automatic configuration feature.

Stationary-roughness-and-contour-measurement-meter-hommel-etamic-waveline-w600-waveline-w800-waveline-w900

A. Waveline W600: Compact measuring systems with simple operation

Simple operation and flexible use: Waveline W600 roughness and contour measurement systems are easy to operate and, with manual height adjustment, a wide range of mounting options and high measurement quality, are the ideal companion for measurements close to production.

Universal, easy-to-use measuring system
High measurement quality thanks to stable mechanics
Unique traverse concept for optimum accessibility of the measuring points
Modern touch probes with high resolution
Interface for probe systems for either roughness or contour measurement with TKU400 or Digiscan probe system
Quick-change adapter QCA enables quick probe system changeover with minimum retooling time due to automatic probe recognition
Sophisticated probe arm technology
Probe arms with magnetic coupling for fast and easy probe arm changeover
All contour probe arms with RFID chip for simplified calibration and automatic configuration
Measuring points freely accessible thanks to unique traverse unit concept
Manual height adjustment with handwheel for precise probe positioning
Optional base plate for mounting on granite plate with T-slot or threaded bushings provides numerous mounting options
Measurement and evaluation software Evovis with modern interface and extensive functions
Subsequent expansion of the measuring system possible due to modular design.

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Model	W600R	W600C Digiscan	W600RC Digiscan
Traverse unit [mm]	120	120	120
Measuring column [mm]	300	300	300
Granite plate [mm]	700x400x100	700x400x100	700x400x100

B. Waveline W800: Modular system concept for maximum flexibility

Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W800 have been developed for roughness and contour measuring tasks associated with typically manual or semi-automatic measuring processes. The systems are easy to operate and offer a great variety of analyses thanks to the performant measuring and evaluation software Evovis. The result is the highest standard of measuring accuracy in the shortest time.

The quick-change adapter enables probe systems to be changed over without having to use any tools. Probe arms and probe system are equipped with magnetic coupling making the exchange of probe arms easy and fast. This means you can take a flexible approach towards all of your measuring requirements.

The system automatically detects the intelligent contour probe arms with RFID identification and adjusts the optimal measurement conditions, thus practically eliminating operating errors and incorrect measurements.

Universal, easy-to-use measuring system
Modern, high-resolution probe systems
High measurement quality thanks to stable mechanics
Sophisticated probe arm technology
Unique traverse unit concept for optimum access to measuring positions
Probe arms with magnetic coupling for fast and easy probe arm change over
All contour probe arms equipped with an RFID chip for simplified calibration and automatic configuration
Quick-change adapter QCA enables quick probe system changeover with minimum retooling time and automatic configuration feature
Horizontal motion of the probe system occurs via the traverse unit enclosure, meaning the probe arm is always in front of the traverse unit
Control panel for easy, direct operation of the most important measuring and control functions as well as emergency stop function with restart at interrupted axis position.

Stationary-roughness-and-contour-measurement-meter-hommel-etamic-waveline-w600-waveline-w800-waveline-w900

Model	W800R	W800C Digiscan	W800RC Digiscan	W800RC Surfscan	W800RC Nanoscan
Traverse unit [mm]	120 or 200	120 or 200	120 or 200	120 or 200	120 or 200
Measuring column [mm]	500 or 800	500 or 800	500 or 800	500 or 800	500 or 800
Granite plate [mm]	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520

C. Waveline W900: Fast measuring axes for maximum precision and performance

The Waveline W900 series was developed for measuring tasks in high-performance areas, e.g. in the environment of automated process chains. The systems have two interfaces for coupling the touch probes and optionally additional axes for automating measuring sequences. The arrangement of the touch probes and the innovative traverse concept ensure optimum access to the measuring points.

W900 Stationary roughness and contour measurement meter are used especially in automated measuring sequences for particularly fast and precise results. With their measuring axes, they guarantee short measuring cycles for complex measuring tasks and thus meet the highest demands on measuring technology. The high-precision traverse unit delivers excellent measuring accuracy in conjunction with the Nanoscan touch probe for combined roughness and contour measurement.

Fast measurement technology
Highly flexible, dynamic measurement
Excellent measuring accuracy in combination with Nanoscan probe system
Extensive options for automated, CNC-controlled measurement runs
Dual operation of two probe systems; a roughness probe system can also be installed on the front of the traverse unit; also suitable for optional rotary module
Optional motorized tilt unit for precise adjustment of the tilt angle and automatic alignment of the probe to the workpiece level
Measuring Z column with linear scale at a resolution of 0.1 μm for measurement of vertical distances outside the Z measuring range of the probe; requires probe arm with double probe tip
Additional motorized Y axis or X-Y axis combination for automatic zenith search, topography measurement and workpiece positioning
Optional rotational axis for roughness measurement on cylindrical workpieces in circumferential and axial direction.

Stationary-roughness-and-contour-measurement-meter-hommel-etamic-waveline-w600-waveline-w800-waveline-w900

Model	W900R	W900C Digiscan	W900RC Digiscan	W900RC Surfscan	W900RC Nanoscan
Traverse unit [mm]	120 or 200	120 or 200	120 or 200	120 or 200	120 or 200
Measuring column [mm]	500 or 800	500 or 800	500 or 800	500 or 800	500 or 800
Granite plate [mm]	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520	700x520 or 1000x520

II. Probe systems with quick-change adapter QCA

Probe systems with quick-change adapter QCA allow quick and simple system changeovers to accommodate new measurement tasks and thus guarantee reproducible measurement results.

All probe systems equipped with QCA interfaces
Automatic setup after probe changeover
Probe changeover without tools
Precise, repeatable mechanical position – Hot-plug-capable
Future-proof.

TKU400 with TAM probe arms: roughness measurement

Universal roughness probe system
Large measuring range
Suitable for length and transverse measurements.
Easily exchangeable probe arms

Digiscan with TD probe arms: contour measurement

Digital measuring system with high resolution
Optional top/bottom measurement
Probe arms with magnetic coupling and electronic detection
Extensive range of probe arm solutions.

Surfscan with WCN probe arms: roughness and contour measurement rolled into one

Roughness measurement in the measuring range of 8 mm with a resolution of 3 nm
Probe arms with magnetic coupling and electronic detection
Optional top/bottom measurement.

Nanoscan with WCN probe arms: roughness and contour measurement rolled into one

Ultra-precise opto-mechanical probe system
Wide measuring range with extremely high resolution
Excellent roughness and contour measuring accuracy in conjunction with W900.

Probe arm	Measuring range \| Resolution
Probe system	TKU400	Digiscan	Surfscan	Nanoscan
Standard length	±400 μm \| 1 nm	60 mm \| 10 nm	8 mm \| 3 nm	24 mm \| 0.3 nm
2-fold length	±800 μm \| 2 nm	90 mm \| 15 nm	16 mm \| 6 nm	48 mm \| 0.6 nm
Use with measuring system	W600, W800, W900	W600, W800, W900	W800, W900	W800, W900

III. Evovis: Evaluation software for roughness and contour measurement for Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900

Evovis the measurement and evaluation software for roughness and contour measurement, offers a standardized user interface with easy-to-understand control logic and extensive support functions for designing individual measurement applications. Its applications range from simple measurements of a single characteristic to fully automated measurement applications within the Industry 4.0 environment.

User-friendly, intuitive operation

Modern user interface for safe operation with little training needed
Central control with all frequently used operating and display functions in one view
Measuring station control with live display
Automatic system configuration when changing the probe system or probe arm
Extensive statistical functions
Interactive analysis and evaluation functions
Central administration of all test characteristics
Evaluation of roughness parameters in the contour profile
Roughness and contour parameters summarized in a table for further statistical evaluation.

Optimized measurement runs: CNC editor

Fast and easy programming of automated measurement and evaluation processes with a click of the mouse
Clear representation in a graphic workflow
Reduction of operator influences
Comprehensive function library.

Option CNC Professional:

Programming of complex, automated measuring processes with axis control, electronic workpiece identification,
Simplified user interface and automated data export.

Documented quality:

Individual, free design of test plans as well as display and print reports
Easy design and management of templates
Automatic, electronic archiving of the reports.

IV. Evovis: Software functions and options for specific measurement tasks

Roughness measurement and evaluation:

All common parameters in accordance with ISO 21920, ISO 4287 and other ISO and national standards
Assistant for quick selection of roughness parameters and definition of the measurement conditions for safe processes and simple implementation of complex measurement tasks
Interactive profile analysis functions for surface parameters
Evaluation of the measurement results according to tolerance specifications with display in a compact form
All globally standardized surface parameters for primary, roughness and waviness profiles
Optionally expandable with function-oriented parameters.

Contour measurement and evaluation:

Contour evaluation with assessment of geometric dimensions, tolerancing of profiles and extensive functions for the assessment of line profile deviations
Processing of several profiles/characteristics in one test plan
Evaluation of complex geometric elements such as Gothic arcs or edge geometries
Icon-based features for quick test plan creation
Realization of complex applications thanks to precise fitting procedures and various auxiliary elements.

Evaluation of several profiles in one run:

Top/Bottom measurement
Parallelism, angles and distance between several profiles.

Automated calibration (contour):

Guided calibration process with recording of the history – Automatic calibration in CNC mode
Management of the calibration means.

Options:

qs-STAT® (Q-DAS ASCII transfer format): AQDEF- certified statistics export interface
Dominant waviness according to VDA 2007
TwistLive® twist evaluation in accordance with Daimler standard MBN 31 007-07 with additional quick analysis method and live display
3D topography evaluation.

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Technical data for Stationary roughness and contour measurement meter HOMMEL ETAMIC Waveline W600 & Waveline W800 & Waveline W900

Measuring systems:

Model	W600		W800				W900
Traverse unit	±400 μm \| 1 nm		60 mm \| 10 nm				8 mm \| 3 nm
Traverse length	120 mm		120 mm \| 200 mm				120 mm \| 200 mm
Straightness	0.9 μm		0.4 μm \| 0.6 μm				0.2 μm \| 0.4 μm
Positioning repeatability	<50 μm		<50 μm				<10 μm
X axis scale resolution	0.1 μm		0.1 μm				0.01 μm
Max. positioning speed	20 mm/s		20 mm/s				200 mm/s
Max. basic disturbance Rz (0.2 mm/s)	<60 nm		<50 nm				<30 nm
Number of probe system interfaces	1, bottom		1, bottom				2, bottom & front
Measuring column	Zpos 300M		Zmove 500 \| Zmove 800				Zmove 500 \| Zmove 800
Vertical travel	300 mm		500 mm \| 800 mm				500 mm \| 800 mm
Positioning repeatability	–		<50 μm				<10 μm
Max. positioning speed	–		20 mm/s				80 mm/s
Scale resolution	–		–				0.1 μm
Vertical distance measurement	–		–				absolute angle, inner/outer diameter
Tilt unit
Tilt range1)	–		± 45°				± 45°
Fine adjustment (optional)	–		± 5°				± 5°
Probe system accuracy	TKU400	Digiscan	TKU400	Digiscan	Surfscan	Nanoscan	TKU400	Digiscan	Surfscan	Nanoscan
Rz min. tolerance cg/cgk ≥ 1.33	1.2 μm	–	0.8 μm	–	0.8 μm	0.5 μm	0.5 μm	–	0.5 μm	0.15 μm
Radius measurement R = 15 mm	–	±7 μm	–	±5 μm	±5 μm	±3 μm	–	±3 μm	±3 μm	±1 μm
Radius form deviation	–	5 μm	–	3 μm	3 μm	1.5 μm	–	1.5 μm	1.5 μm	0.8 μm

Probe systems:

Probe system	TKU400	Digiscan	Surfscan	Nanoscan
Measurement of	roughness	contour	roughness & contour	roughness & contour
Measuring range/resolution (Standard probe arm length)	± 400 μm/1 nm2)	60 mm/10 nm2)	8 mm / 3 nm2)	24 mm/0.3 nm2)
Measuring range/resolution (1.5x probe arm length)	± 600 μm/1.5 nm2)	90 mm/15 nm2)	–	–
Measuring range/resolution (2x probe arm length)	± 800 μm/2 nm2)	–	16 mm/6 nm2)	48 mm/0.6 nm2)
Top/bottom measurement	no	optional	optional	yes
Measuring principle	analog	digital	digital	digital
Probe identification	yes	yes	yes	yes
Probe force setting	fixed	electronic	electronic	electronic
Probe arm identification	no	yes	yes	yes
Probe arm interface	magnetic	magnetic	magnetic	magnetic

System configurations:

System configuration	Description
W600R \| W800R \| W900R	roughness measuring station with TKU400 probe system
W600C \| W800C Digiscan \| W900C Digiscan	contour measuring station with Digiscan probe system
W800RC TKU \| W900RC TKU	roughness and contour measuring station with TKU400 probe system
W600RC Digiscan \| W800RC Digiscan \| W900RC Digiscan	roughness and contour measuring station with separate TKU400 and Digiscan probe systems
W800RC Surfscan \| W900RC Surfscan	combined roughness and contour measuring station with Surfscan probe system
W800RC Nanoscan \| W900RC Nanoscan	combined roughness and contour measuring station with Nanoscan probe system
Optional for all system configurations	traverse unit 120 mm or 200 mm measuring column 500 mm or 800 mm granite plate 700 x 520 mm or 1000 x 520 mm desktop, instrument table, measuring cabin